A fading-resistant method for RFID-antenna structural mode measurement

Antonis G. Dimitriou, John Kimionis, Aggelos Bletsas, John N. Sahalos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a prototype device to measure the tagantenna's structural mode term is proposed. The device comprises a switching transistor, controlled by a microcontroller, and a reverse-biased varactor diode connected to the transistor. The antenna's load is selectively modified by applying the appropriate DC voltage on the varactor. Antenna's structural mode is evaluated by measuring the backscattered modulated field for three states of the varactor. In contrast to prior art: i) the proposed device can be conveniently used to measure the structural mode of any antenna, via an RF connector, without the need to successively attach different loads to the antenna under test, ii) measurements can be performed under fading/changing conditions, as fading-effects are removed, as demonstrated herein. The device can be used to evaluate backscatter communications for different tag-loading. Furthermore, it could operate as an RF sensor, where the sensor's voltage 'drives' the varactor's capacitance.

Original languageEnglish
Title of host publication2012 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2012
Pages443-448
Number of pages6
DOIs
Publication statusPublished - 2012
Event2012 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2012 - Nice, France
Duration: 5 Nov 20127 Nov 2012

Other

Other2012 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2012
CountryFrance
CityNice
Period5/11/127/11/12

Keywords

  • antenna
  • backscattering
  • RFID
  • structural-mode

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  • Cite this

    Dimitriou, A. G., Kimionis, J., Bletsas, A., & Sahalos, J. N. (2012). A fading-resistant method for RFID-antenna structural mode measurement. In 2012 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2012 (pp. 443-448). [6404564] https://doi.org/10.1109/RFID-TA.2012.6404564