Dependability threats

Cristiana Bolchini, Maria K. Michael, Antonio Miele, Stelios Neophytou

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Abstract

    This chapter discusses dependability threads for modern integrated circuits that affect both their correct operation and performance. The text provides an overview of fault/error models adopted in methodologies for dependability assessment, analysis, and mitigation. Faults are categorized based on their applicability in the various abstraction layers. Their applicability to modern design trends such as FPGAs and NoCs is also presented. Furthermore, models for emerging and future dependability issues are discussed in the same rationale. In particular, special attention is given to those issues that typically arise during the operational life of the devices, causing either transient, intermittent or permanent failures, including aging and wear-out effects that directly affect their lifetime.

    Original languageEnglish
    Title of host publicationDependable Multicore Architectures at Nanoscale
    PublisherSpringer International Publishing
    Pages37-92
    Number of pages56
    ISBN (Electronic)9783319544229
    ISBN (Print)9783319544212
    DOIs
    Publication statusPublished - 28 Aug 2017

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  • Cite this

    Bolchini, C., Michael, M. K., Miele, A., & Neophytou, S. (2017). Dependability threats. In Dependable Multicore Architectures at Nanoscale (pp. 37-92). Springer International Publishing. https://doi.org/10.1007/978-3-319-54422-9_2