Direct solution and Monte Carlo simulation of the inverse problem in two-layered half-space

I. C. Mertzanides, S. K. Goudos, J. N. Sahalos

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

A direct method is developed for determining the dielectric properties and thickness of lossy two-layered media. The technique is based on the study of the frequency response of the complex reflection coefficient. The frequency span must contain at least two adjacent extreme values of the real part of the input impedance. Monte Carlo simulations were produced in order to test the accuracy of the method. Applications in hydrology, engineering and environmental geology are discussed.

Original languageEnglish
Pages (from-to)51-60
Number of pages10
JournalElectrical Engineering
Volume84
Issue number1
DOIs
Publication statusPublished - Feb 2002

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