Direct solution and Monte Carlo simulation of the inverse problem in two-layered half-space

I. C. Mertzanides; S. K. Goudos; J. N. Sahalos

doi:10.1007/s002020100081

Direct solution and Monte Carlo simulation of the inverse problem in two-layered half-space

I. C. Mertzanides, S. K. Goudos, J. N. Sahalos

Department of Engineering

Aristotle University of Thessaloniki

Research output: Contribution to journal › Article › peer-review

Abstract

A direct method is developed for determining the dielectric properties and thickness of lossy two-layered media. The technique is based on the study of the frequency response of the complex reflection coefficient. The frequency span must contain at least two adjacent extreme values of the real part of the input impedance. Monte Carlo simulations were produced in order to test the accuracy of the method. Applications in hydrology, engineering and environmental geology are discussed.

Original language	English
Pages (from-to)	51-60
Number of pages	10
Journal	Electrical Engineering
Volume	84
Issue number	1
DOIs	https://doi.org/10.1007/s002020100081
Publication status	Published - Feb 2002

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abstract = "A direct method is developed for determining the dielectric properties and thickness of lossy two-layered media. The technique is based on the study of the frequency response of the complex reflection coefficient. The frequency span must contain at least two adjacent extreme values of the real part of the input impedance. Monte Carlo simulations were produced in order to test the accuracy of the method. Applications in hydrology, engineering and environmental geology are discussed.",

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Direct solution and Monte Carlo simulation of the inverse problem in two-layered half-space

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