Efficient deterministic test generation for BIST schemes with LFSR reseeding

Stelios Neophytou, Maria K. Michael, Spyros Tragoudas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

We propose a novel method for generating test patterns that can be encoded efficiently using reseeding of LFSR-based schemes for hybrid BIST. Our focus is to reduce the number of deterministic tests while keeping their overall number of specified bits small and, thus, reduce the storage requirements for the LFSR seeds. The proposed solution is based on test function manipulation and generates a compact test set in which individual tests have a high number of unspecified bits. The method uses Binary Decision Diagrams (BDDs) and a modified version of the min-cost max-matching problem on graphs. The obtained experimental results clearly demonstrate the impact of the proposed ATPG algorithm in reducing the on-chip seed storage, when combined with the considered BIST schemes.

Original languageEnglish
Title of host publicationProceedings - IOLTS 2006
Subtitle of host publication12th IEEE International On-Line Testing Symposium
Pages43-48
Number of pages6
Volume2006
DOIs
Publication statusPublished - 2006
EventIOLTS 2006: 12th IEEE International On-Line Testing Symposium - Como, Italy
Duration: 10 Jul 200612 Jul 2006

Other

OtherIOLTS 2006: 12th IEEE International On-Line Testing Symposium
CountryItaly
CityComo
Period10/07/0612/07/06

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  • Cite this

    Neophytou, S., Michael, M. K., & Tragoudas, S. (2006). Efficient deterministic test generation for BIST schemes with LFSR reseeding. In Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium (Vol. 2006, pp. 43-48). [1655514] https://doi.org/10.1109/IOLTS.2006.26