Efficient deterministic test generation for BIST schemes with LFSR reseeding

Keyphrases

• Test Case Generation 100%
• Deterministic Test 100%
• LFSR Reseeding 100%
• On chip 50%
• Compact Test 50%
• Test Functions 50%
• Test Pattern 50%
• Binary Decision Diagram 50%
• Matching Problem 50%
• Storage Requirement 50%
• Seed Storage 50%
• Hybrid BIST 50%

Computer Science

• Test Generation 100%
• linear-feedback shift register 100%
• Experimental Result 33%
• binary decision diagram 33%
• Modified Version 33%
• Storage Requirement 33%

Engineering

• Built-in Self Test 100%
• Experimental Result 33%
• Max 33%
• Storage Requirement 33%