European Test Symposium Teams: an Anniversary Snapshot

M. Jenihhin; J. Raik; A. Jutman; N. Cherezova; R. Ubar; L. Miclea; S. Enyedi; I. Stefan; O. Stan; C. Corches; Z. Peng; P. Eles; R. Drechsler; S. Eggersglus; G. Fey; A. Glowatz; D. Tille; G. Gielen; A. Coyette; W. Dobbelaere; R. Vanhooren; P. Y. Chuang; E. J. Marinissen; G. Di Natale; M. Barragan; P. Maistri; S. Mir; E. I. Vatajelu; P. Bernardi; S. Di Carlo; P. Prinetto; M. Sonza Reorda; M. Violante; H. G. Stratigopoulos; M. K. Michael; S. Neophytou; S. Hadjitheophanous; K. Christou; M. Skitsas; A. Bosio; B. Deveautour; P. Girard; M. Traiola; A. Virazel; F. Fernandes Dos Santos; A. Kritikakou; G. Casagranda; M. Vallero; F. Vella; P. Rech; L. M. Bolzani Poehls; M. Krstic; M. Andjelkovic; F. Vargas; G. Tshagharyan; G. Harutyunyan; V. Vardanian; S. Shoukourian; Y. Zorian; J. Dworak; K. Nepal; T. Manikas; M. Taouil; M. Fieback; A. Gebregiorgis; R. Bishnoi; S. Hamdioui; A. Chatterjee; A. Saha; S. Komarraju; K. Ma; C. Amarnath; M. Tahoori; M. Mayahinia; M. Rajabalipanah; K. Basharkhah; N. Nosrati; Z. Jahanpeima; Z. Navabi; H. J. Wunderlich; S. Hellebrand

doi:10.1109/ETS63895.2025.11049652

European Test Symposium Teams: an Anniversary Snapshot

M. Jenihhin
, J. Raik
, A. Jutman
, N. Cherezova
, R. Ubar
, L. Miclea
, S. Enyedi
, I. Stefan
, O. Stan
, C. Corches
, Z. Peng
, P. Eles
, R. Drechsler
, S. Eggersglus
, G. Fey
, A. Glowatz
, D. Tille
, G. Gielen
, A. Coyette
, W. Dobbelaere

R. Vanhooren, P. Y. Chuang, E. J. Marinissen, G. Di Natale, M. Barragan, P. Maistri, S. Mir, E. I. Vatajelu, P. Bernardi, S. Di Carlo, P. Prinetto, M. Sonza Reorda, M. Violante, H. G. Stratigopoulos, M. K. Michael, S. Neophytou, S. Hadjitheophanous, K. Christou, M. Skitsas, A. Bosio, B. Deveautour, P. Girard, M. Traiola, A. Virazel, F. Fernandes Dos Santos, A. Kritikakou, G. Casagranda, M. Vallero, F. Vella, P. Rech, L. M. Bolzani Poehls, M. Krstic, M. Andjelkovic, F. Vargas, G. Tshagharyan, G. Harutyunyan, V. Vardanian, S. Shoukourian, Y. Zorian, J. Dworak, K. Nepal, T. Manikas, M. Taouil, M. Fieback, A. Gebregiorgis, R. Bishnoi, S. Hamdioui, A. Chatterjee, A. Saha, S. Komarraju, K. Ma, C. Amarnath, M. Tahoori, M. Mayahinia, M. Rajabalipanah, K. Basharkhah, N. Nosrati, Z. Jahanpeima, Z. Navabi, H. J. Wunderlich, S. Hellebrand

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team's section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.

Original language	English
Title of host publication	Proceedings - 2025 IEEE European Test Symposium, ETS 2025
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798331594503
DOIs	https://doi.org/10.1109/ETS63895.2025.11049652
Publication status	Published - 2025
Externally published	Yes
Event	2025 IEEE European Test Symposium, ETS 2025 - Tallinn, Estonia Duration: 26 May 2025 → 30 May 2025

Publication series

Name	Proceedings of the European Test Workshop
ISSN (Print)	1530-1877
ISSN (Electronic)	1558-1780

Conference

Conference	2025 IEEE European Test Symposium, ETS 2025
Country/Territory	Estonia
City	Tallinn
Period	26/05/25 → 30/05/25

Access to Document

10.1109/ETS63895.2025.11049652

Cite this

Jenihhin, M., Raik, J., Jutman, A., Cherezova, N., Ubar, R., Miclea, L., Enyedi, S., Stefan, I., Stan, O., Corches, C., Peng, Z., Eles, P., Drechsler, R., Eggersglus, S., Fey, G., Glowatz, A., Tille, D., Gielen, G., Coyette, A., ... Hellebrand, S. (2025). European Test Symposium Teams: an Anniversary Snapshot. In Proceedings - 2025 IEEE European Test Symposium, ETS 2025 (Proceedings of the European Test Workshop). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ETS63895.2025.11049652

@inproceedings{0fc343b7bbdb47449663341a025f5c50,

title = "European Test Symposium Teams: an Anniversary Snapshot",

abstract = "The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team's section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.",

author = "M. Jenihhin and J. Raik and A. Jutman and N. Cherezova and R. Ubar and L. Miclea and S. Enyedi and I. Stefan and O. Stan and C. Corches and Z. Peng and P. Eles and R. Drechsler and S. Eggersglus and G. Fey and A. Glowatz and D. Tille and G. Gielen and A. Coyette and W. Dobbelaere and R. Vanhooren and Chuang, \{P. Y.\} and Marinissen, \{E. J.\} and \{Di Natale\}, G. and M. Barragan and P. Maistri and S. Mir and Vatajelu, \{E. I.\} and P. Bernardi and \{Di Carlo\}, S. and P. Prinetto and \{Sonza Reorda\}, M. and M. Violante and Stratigopoulos, \{H. G.\} and Michael, \{M. K.\} and S. Neophytou and S. Hadjitheophanous and K. Christou and M. Skitsas and A. Bosio and B. Deveautour and P. Girard and M. Traiola and A. Virazel and \{Fernandes Dos Santos\}, F. and A. Kritikakou and G. Casagranda and M. Vallero and F. Vella and P. Rech and \{Bolzani Poehls\}, \{L. M.\} and M. Krstic and M. Andjelkovic and F. Vargas and G. Tshagharyan and G. Harutyunyan and V. Vardanian and S. Shoukourian and Y. Zorian and J. Dworak and K. Nepal and T. Manikas and M. Taouil and M. Fieback and A. Gebregiorgis and R. Bishnoi and S. Hamdioui and A. Chatterjee and A. Saha and S. Komarraju and K. Ma and C. Amarnath and M. Tahoori and M. Mayahinia and M. Rajabalipanah and K. Basharkhah and N. Nosrati and Z. Jahanpeima and Z. Navabi and Wunderlich, \{H. J.\} and S. Hellebrand",

note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 2025 IEEE European Test Symposium, ETS 2025 ; Conference date: 26-05-2025 Through 30-05-2025",

year = "2025",

doi = "10.1109/ETS63895.2025.11049652",

language = "English",

series = "Proceedings of the European Test Workshop",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "Proceedings - 2025 IEEE European Test Symposium, ETS 2025",

}

Jenihhin, M, Raik, J, Jutman, A, Cherezova, N, Ubar, R, Miclea, L, Enyedi, S, Stefan, I, Stan, O, Corches, C, Peng, Z, Eles, P, Drechsler, R, Eggersglus, S, Fey, G, Glowatz, A, Tille, D, Gielen, G, Coyette, A, Dobbelaere, W, Vanhooren, R, Chuang, PY, Marinissen, EJ, Di Natale, G, Barragan, M, Maistri, P, Mir, S, Vatajelu, EI, Bernardi, P, Di Carlo, S, Prinetto, P, Sonza Reorda, M, Violante, M, Stratigopoulos, HG, Michael, MK, Neophytou, S, Hadjitheophanous, S, Christou, K, Skitsas, M, Bosio, A, Deveautour, B, Girard, P, Traiola, M, Virazel, A, Fernandes Dos Santos, F, Kritikakou, A, Casagranda, G, Vallero, M, Vella, F, Rech, P, Bolzani Poehls, LM, Krstic, M, Andjelkovic, M, Vargas, F, Tshagharyan, G, Harutyunyan, G, Vardanian, V, Shoukourian, S, Zorian, Y, Dworak, J, Nepal, K, Manikas, T, Taouil, M, Fieback, M, Gebregiorgis, A, Bishnoi, R, Hamdioui, S, Chatterjee, A, Saha, A, Komarraju, S, Ma, K, Amarnath, C, Tahoori, M, Mayahinia, M, Rajabalipanah, M, Basharkhah, K, Nosrati, N, Jahanpeima, Z, Navabi, Z, Wunderlich, HJ & Hellebrand, S 2025, European Test Symposium Teams: an Anniversary Snapshot. in Proceedings - 2025 IEEE European Test Symposium, ETS 2025. Proceedings of the European Test Workshop, Institute of Electrical and Electronics Engineers Inc., 2025 IEEE European Test Symposium, ETS 2025, Tallinn, Estonia, 26/05/25. https://doi.org/10.1109/ETS63895.2025.11049652

European Test Symposium Teams: an Anniversary Snapshot. / Jenihhin, M.; Raik, J.; Jutman, A. et al.
Proceedings - 2025 IEEE European Test Symposium, ETS 2025. Institute of Electrical and Electronics Engineers Inc., 2025. (Proceedings of the European Test Workshop).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - European Test Symposium Teams

T2 - 2025 IEEE European Test Symposium, ETS 2025

AU - Jenihhin, M.

AU - Raik, J.

AU - Jutman, A.

AU - Cherezova, N.

AU - Ubar, R.

AU - Miclea, L.

AU - Enyedi, S.

AU - Stefan, I.

AU - Stan, O.

AU - Corches, C.

AU - Peng, Z.

AU - Eles, P.

AU - Drechsler, R.

AU - Eggersglus, S.

AU - Fey, G.

AU - Glowatz, A.

AU - Tille, D.

AU - Gielen, G.

AU - Coyette, A.

AU - Dobbelaere, W.

AU - Vanhooren, R.

AU - Chuang, P. Y.

AU - Marinissen, E. J.

AU - Di Natale, G.

AU - Barragan, M.

AU - Maistri, P.

AU - Mir, S.

AU - Vatajelu, E. I.

AU - Bernardi, P.

AU - Di Carlo, S.

AU - Prinetto, P.

AU - Sonza Reorda, M.

AU - Violante, M.

AU - Stratigopoulos, H. G.

AU - Michael, M. K.

AU - Neophytou, S.

AU - Hadjitheophanous, S.

AU - Christou, K.

AU - Skitsas, M.

AU - Bosio, A.

AU - Deveautour, B.

AU - Girard, P.

AU - Traiola, M.

AU - Virazel, A.

AU - Fernandes Dos Santos, F.

AU - Kritikakou, A.

AU - Casagranda, G.

AU - Vallero, M.

AU - Vella, F.

AU - Rech, P.

AU - Bolzani Poehls, L. M.

AU - Krstic, M.

AU - Andjelkovic, M.

AU - Vargas, F.

AU - Tshagharyan, G.

AU - Harutyunyan, G.

AU - Vardanian, V.

AU - Shoukourian, S.

AU - Zorian, Y.

AU - Dworak, J.

AU - Nepal, K.

AU - Manikas, T.

AU - Taouil, M.

AU - Fieback, M.

AU - Gebregiorgis, A.

AU - Bishnoi, R.

AU - Hamdioui, S.

AU - Chatterjee, A.

AU - Saha, A.

AU - Komarraju, S.

AU - Ma, K.

AU - Amarnath, C.

AU - Tahoori, M.

AU - Mayahinia, M.

AU - Rajabalipanah, M.

AU - Basharkhah, K.

AU - Nosrati, N.

AU - Jahanpeima, Z.

AU - Navabi, Z.

AU - Wunderlich, H. J.

AU - Hellebrand, S.

PY - 2025

Y1 - 2025

N2 - The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team's section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.

AB - The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team's section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.

UR - https://www.scopus.com/pages/publications/105011046254

U2 - 10.1109/ETS63895.2025.11049652

DO - 10.1109/ETS63895.2025.11049652

M3 - Conference contribution

AN - SCOPUS:105011046254

T3 - Proceedings of the European Test Workshop

BT - Proceedings - 2025 IEEE European Test Symposium, ETS 2025

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 26 May 2025 through 30 May 2025

ER -

European Test Symposium Teams: an Anniversary Snapshot

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Publication series

Conference

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