Full-wave embedding - De-embedding procedures for RFID measurement space characterization

Theodoros N. Kaifas, Dimitrios G. Babas, Elias E. Vafiadis, John N. Sahalos

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the current work, full-wave assisted embedding/ de-embedding procedures for the measurement space characterization of small radiating systems, are contributed. The problem, of poor match between analysis and measurement results, poor match among results of different methods or methods using different fixtures, is well known but not well understood since due to small electrical size of the devices under test various issues arise. To address those problems, we contribute the concept of full-wave assisted embedding/ de-embedding accompanied by calibration procedures based on generalized error correction models.

Original languageEnglish
Title of host publication8th European Conference on Antennas and Propagation, EuCAP 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1057-1061
Number of pages5
ISBN (Electronic)9788890701849
DOIs
Publication statusPublished - 2014
Event8th European Conference on Antennas and Propagation, EuCAP 2014 - The Hague, Netherlands
Duration: 6 Apr 201411 Apr 2014

Other

Other8th European Conference on Antennas and Propagation, EuCAP 2014
Country/TerritoryNetherlands
CityThe Hague
Period6/04/1411/04/14

Keywords

  • Calibration procedure
  • Embedding-deembedding procedures
  • RFID measurement

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