Functions for quality transition fault tests

Maria K. Michael; Stelios Neophytou; Spyros Tragoudas

doi:10.1109/ISQED.2005.60

Functions for quality transition fault tests

Maria K. Michael, Stelios Neophytou, Spyros Tragoudas

Department of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS'85 and ISCAS'89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.

Original language	English
Title of host publication	Proceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005
Pages	327-332
Number of pages	6
DOIs	https://doi.org/10.1109/ISQED.2005.60
Publication status	Published - 2005
Event	6th International Symposium on Quality Electronic Design, ISQED 2005 - San Jose, CA, United States Duration: 21 Mar 2005 → 23 Mar 2005

Other

Other	6th International Symposium on Quality Electronic Design, ISQED 2005
Country/Territory	United States
City	San Jose, CA
Period	21/03/05 → 23/03/05

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10.1109/ISQED.2005.60

Cite this

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title = "Functions for quality transition fault tests",

abstract = "The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS'85 and ISCAS'89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.",

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AB - The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS'85 and ISCAS'89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.

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M3 - Conference contribution

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BT - Proceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005

T2 - 6th International Symposium on Quality Electronic Design, ISQED 2005

Y2 - 21 March 2005 through 23 March 2005

ER -

Functions for quality transition fault tests

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