Functions for quality transition fault tests

Maria K. Michael, Stelios Neophytou, Spyros Tragoudas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The paper shows how to generate a function that contains all possible tests to detect a transition fault. Moreover, a systematic methodology is presented that derives the functions for all transition faults based on only two circuit traversals. Quality tests are generated by requiring that the function formulation considers established sensitization criteria to either activate a transition at the fault site or propagate it to a circuit output. Experimental results on the ISCAS'85 and ISCAS'89 benchmarks demonstrate the promise of the method which can also lead to efficient compaction methods for transition faults.

Original languageEnglish
Title of host publicationProceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005
Pages327-332
Number of pages6
DOIs
Publication statusPublished - 2005
Event6th International Symposium on Quality Electronic Design, ISQED 2005 - San Jose, CA, United States
Duration: 21 Mar 200523 Mar 2005

Other

Other6th International Symposium on Quality Electronic Design, ISQED 2005
CountryUnited States
CitySan Jose, CA
Period21/03/0523/03/05

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  • Cite this

    Michael, M. K., Neophytou, S., & Tragoudas, S. (2005). Functions for quality transition fault tests. In Proceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005 (pp. 327-332). [1410604] https://doi.org/10.1109/ISQED.2005.60