Functions for quality transition-fault tests and their applications in test-set enhancement

Stelios N. Neophytou, Maria K. Michael, Spyros Tragoudas

Research output: Contribution to journalArticlepeer-review


A method to implicitly derive all tests for each transition fault under established fault-sensitization criteria is presented. The derived quality test functions are enhanced in three different ways to derive better quality test sets. One enhancement restricts fault sensitization along critical subcircuits whose paths have long delays under a fixed-delay model. Another manipulates the functions to generate compact test sets. The last one enriches the test set with additional test vectors so that transition faults are tested through several activation and propagation paths without path enumeration. Experimental results demonstrate the effectiveness of deriving such enhanced test functions.

Original languageEnglish
Pages (from-to)3026-3035
Number of pages10
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Issue number12
Publication statusPublished - Dec 2006


  • Binary decision diagrams (BDDs)
  • Critical-path testing
  • Delay testing
  • Function-based testing
  • Nonenumerative path sensitization
  • Test compaction
  • Test set enrichment


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