Generating diverse test sets for multiple fault detections based on fault cone partitioning

Keyphrases

• Circuit Dynamics 33%
• Circuit Size 33%
• Defect Detection 33%
• Dynamic Fault Models 33%
• Fault Coverage 33%
• Fault Impact 33%
• Fault Model 33%
• Fault Propagation Path 33%
• Multiple Fault Detection 100%
• N-detect 100%
• Path Segment 33%
• Propagation Path 66%
• Static Faults 33%
• Stuck-at 33%
• Test Case Generation 33%
• Transition Delay Fault 33%

Computer Science

• Experimental Result 33%
• Fault Coverage 33%
• Fault detection 100%
• Propagation Path 100%
• Test Generation 33%

Engineering

• Experimental Result 33%
• Fault Model 66%
• Propagation Path 100%