Hierarchical fault compatibility identification for test generation with a small number of specified bits

Stelios Neophytou, Maria K. Michael

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint

Dive into the research topics of 'Hierarchical fault compatibility identification for test generation with a small number of specified bits'. Together they form a unique fingerprint.

Keyphrases

Computer Science

Engineering