Multiple detection test generation with diversified fault partitioning paths

Keyphrases

• N-detect 100%
• Test Case Generation 100%
• Multiplex Detection 100%
• Detection Test 100%
• Proposed Methodology 33%
• Fault Model 33%
• Path Segment 33%
• Circuit Size 33%
• Novel Algorithm 33%
• Stuck-at 33%
• Fault Propagation Path 33%
• Dynamic Fault Models 33%
• Transition Delay Fault 33%
• Static Faults 33%
• Circuit Dynamics 33%
• Multiple Fault Detection 33%
• Recent Techniques 33%
• Test Generation Algorithm 33%
• Testing Process 33%
• Nanoscale Technology 33%
• New Systematics 33%

Engineering

• Fault Model 100%
• Experimental Result 50%
• Propagation Path 50%
• Dependability 50%
• Nanoscale 50%

Computer Science

• Test Generation 100%
• Experimental Result 50%
• Propagation Path 50%
• Testing Process 50%
• Fault detection 50%