NiTi smart alloys for memristors with multi-time-scale volatility

J. Georgiou, E. Kyriakides, C. Hadjistassou

Research output: Contribution to journalArticlepeer-review

Abstract

Presented is a novel memristive device based on a NiTi smart alloy. The proposed memristors are simple to implement on existing semiconductor processes and offer multi-time-scale volatility through geometry, alloy composition and chip temperature control. Multi-time-scale volatility is a key requirement for future biomimetic computer architectures.

Original languageEnglish
Pages (from-to)877-879
Number of pages3
JournalElectronics Letters
Volume48
Issue number14
DOIs
Publication statusPublished - 5 Jul 2012

Fingerprint

Dive into the research topics of 'NiTi smart alloys for memristors with multi-time-scale volatility'. Together they form a unique fingerprint.

Cite this