In test set embedding Built-In Self Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we investigate the effect of the size of the test set on the length of the sequence generate of the accumulator structure in order to generate pre-computed test sets and present a method targeting hard-to-detect faults in order to drive down the test generation time.
|Title of host publication||2013 8th IEEE Design and Test Symposium, IDT 2013|
|Publication status||Published - 2013|
|Event||2013 8th IEEE Design and Test Symposium, IDT 2013 - Marrakesh, Morocco|
Duration: 16 Dec 2013 → 18 Dec 2013
|Other||2013 8th IEEE Design and Test Symposium, IDT 2013|
|Period||16/12/13 → 18/12/13|