Test set embedding into accumulator-generated sequences targeting hard-to-detect faults

I. Voyiatzis; S. Neophytou; M. Michaeel; S. Hadjitheophanous; C. Sgouropoulou; C. Efstathiou

doi:10.1109/IDT.2013.6727147

Test set embedding into accumulator-generated sequences targeting hard-to-detect faults

I. Voyiatzis, S. Neophytou, M. Michaeel, S. Hadjitheophanous, C. Sgouropoulou, C. Efstathiou

Department of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In test set embedding Built-In Self Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we investigate the effect of the size of the test set on the length of the sequence generate of the accumulator structure in order to generate pre-computed test sets and present a method targeting hard-to-detect faults in order to drive down the test generation time.

Original language	English
Title of host publication	2013 8th IEEE Design and Test Symposium, IDT 2013
DOIs	https://doi.org/10.1109/IDT.2013.6727147
Publication status	Published - 2013
Event	2013 8th IEEE Design and Test Symposium, IDT 2013 - Marrakesh, Morocco Duration: 16 Dec 2013 → 18 Dec 2013

Other

Other	2013 8th IEEE Design and Test Symposium, IDT 2013
Country/Territory	Morocco
City	Marrakesh
Period	16/12/13 → 18/12/13

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10.1109/IDT.2013.6727147

Cite this

@inproceedings{84beb644293d486db9d8bf6ff0c8e900,

title = "Test set embedding into accumulator-generated sequences targeting hard-to-detect faults",

abstract = "In test set embedding Built-In Self Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we investigate the effect of the size of the test set on the length of the sequence generate of the accumulator structure in order to generate pre-computed test sets and present a method targeting hard-to-detect faults in order to drive down the test generation time.",

author = "I. Voyiatzis and S. Neophytou and M. Michaeel and S. Hadjitheophanous and C. Sgouropoulou and C. Efstathiou",

year = "2013",

doi = "10.1109/IDT.2013.6727147",

language = "English",

isbn = "9781479935253",

booktitle = "2013 8th IEEE Design and Test Symposium, IDT 2013",

note = "2013 8th IEEE Design and Test Symposium, IDT 2013 ; Conference date: 16-12-2013 Through 18-12-2013",

}

Voyiatzis, I, Neophytou, S, Michaeel, M, Hadjitheophanous, S, Sgouropoulou, C & Efstathiou, C 2013, Test set embedding into accumulator-generated sequences targeting hard-to-detect faults. in 2013 8th IEEE Design and Test Symposium, IDT 2013., 6727147, 2013 8th IEEE Design and Test Symposium, IDT 2013, Marrakesh, Morocco, 16/12/13. https://doi.org/10.1109/IDT.2013.6727147

TY - GEN

T1 - Test set embedding into accumulator-generated sequences targeting hard-to-detect faults

AU - Voyiatzis, I.

AU - Neophytou, S.

AU - Michaeel, M.

AU - Hadjitheophanous, S.

AU - Sgouropoulou, C.

AU - Efstathiou, C.

PY - 2013

Y1 - 2013

N2 - In test set embedding Built-In Self Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we investigate the effect of the size of the test set on the length of the sequence generate of the accumulator structure in order to generate pre-computed test sets and present a method targeting hard-to-detect faults in order to drive down the test generation time.

AB - In test set embedding Built-In Self Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we investigate the effect of the size of the test set on the length of the sequence generate of the accumulator structure in order to generate pre-computed test sets and present a method targeting hard-to-detect faults in order to drive down the test generation time.

UR - http://www.scopus.com/inward/record.url?scp=84894431664&partnerID=8YFLogxK

U2 - 10.1109/IDT.2013.6727147

DO - 10.1109/IDT.2013.6727147

M3 - Conference contribution

AN - SCOPUS:84894431664

SN - 9781479935253

BT - 2013 8th IEEE Design and Test Symposium, IDT 2013

T2 - 2013 8th IEEE Design and Test Symposium, IDT 2013

Y2 - 16 December 2013 through 18 December 2013

ER -

Test set embedding into accumulator-generated sequences targeting hard-to-detect faults

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