Test set enhancement for quality transition faults using function-based methods

Stelios Neophytou, Maria K. Michael, Spyros Tragoudas

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


A recent method generates high quality tests for transition faults using functions. Event sensitization criteria as well as path lengths can be taken into consideration during the generation of such test functions. It is shown how to manipulate the test functions to generate compact test sets. Experimental results on ISCAS'85 and ISCAS'89 circuits show that a compaction rate of the order of 70% to 84% is achieved without compromising fault coverage. Moreover, a novel method to enrich the compacted test set with additional vectors is presented so that transition faults are tested through different activation and propagation paths. Such test sets have higher quality, compared to traditional transition fault test sets, since events propagate through many critical paths.

Original languageEnglish
Title of host publicationGLSVSI'05 - Proceedings of the 2005 ACM Great
Number of pages6
Publication statusPublished - 2005
Event2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05 - Chicago, IL, United States
Duration: 17 Apr 200519 Apr 2005


Other2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05
Country/TerritoryUnited States
CityChicago, IL


  • ATPG
  • Critical Paths
  • Delay Test
  • High Quality Test
  • Test Compaction
  • Transition Fault


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