Abstract
A recent method generates high quality tests for transition faults using functions. Event sensitization criteria as well as path lengths can be taken into consideration during the generation of such test functions. It is shown how to manipulate the test functions to generate compact test sets. Experimental results on ISCAS'85 and ISCAS'89 circuits show that a compaction rate of the order of 70% to 84% is achieved without compromising fault coverage. Moreover, a novel method to enrich the compacted test set with additional vectors is presented so that transition faults are tested through different activation and propagation paths. Such test sets have higher quality, compared to traditional transition fault test sets, since events propagate through many critical paths.
Original language | English |
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Title of host publication | GLSVSI'05 - Proceedings of the 2005 ACM Great |
Pages | 182-187 |
Number of pages | 6 |
Publication status | Published - 2005 |
Event | 2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05 - Chicago, IL, United States Duration: 17 Apr 2005 → 19 Apr 2005 |
Other
Other | 2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05 |
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Country/Territory | United States |
City | Chicago, IL |
Period | 17/04/05 → 19/04/05 |
Keywords
- ATPG
- Critical Paths
- Delay Test
- High Quality Test
- Test Compaction
- Transition Fault