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Two layer model for photothermal radiometry applied on semiconducting thin films
M. Nestoros
, Y. Karmiotis
, C. Christofides
Department of Engineering
University of Cyprus
Research output
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Contribution to journal
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peer-review
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Keyphrases
Electronic Contribution
50%
Electronic Parameters
50%
Infrared Emission
50%
Modulated Laser
50%
Optoelectronic Properties
50%
Photothermal
100%
Photothermal Radiometry
100%
Radiometric Signal
50%
Semiconducting Films
100%
Thermal Contribution
50%
Thermal Parameters
50%
Thermophysical Properties
50%
Thin Substrate
50%
Two-layer
50%
Two-layer Model
100%
Physics
Laser Beams
50%
Optoelectronics
50%
Thin Films
100%
Material Science
Thermophysical Property
50%
Thin Films
100%